Acta Optica Sinica, Volume. 41, Issue 18, 1812002(2021)

Surface Defect Detection in Transparent Objects Using Polarized Transmission Structured Light

Wei Wang, Jie Wang, Yiyang Huang, Huimin Yue*, and Yong Liu
Author Affiliations
  • School of OptoElectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 611731, China
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    References(14)

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    [9] Huang Y Y, Yue H M, Fang Y Y et al. Structured-light modulation analysis technique for contamination and defect detection of specular surfaces and transparent objects[J]. Optics Express, 27, 37721-37735(2019).

    [10] Song Y P, Yue H M, Zhou Z et al. Detection of specular surface defects with eliminating dusts based on polarized structured-light illumination[J]. Proceedings of SPIE, 10839, 108391L(2019).

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    Wei Wang, Jie Wang, Yiyang Huang, Huimin Yue, Yong Liu. Surface Defect Detection in Transparent Objects Using Polarized Transmission Structured Light[J]. Acta Optica Sinica, 2021, 41(18): 1812002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 5, 2021

    Accepted: Apr. 13, 2021

    Published Online: Sep. 3, 2021

    The Author Email: Yue Huimin (yuehuimin@uestc.edu.cn)

    DOI:10.3788/AOS202141.1812002

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