Analysis and processing of CCD noise

[in Chinese]; [in Chinese]; [in Chinese]

Infrared and Laser Engineering, Volume. 33, Issue 4, 343(2004)

[in Chinese]*... [in Chinese] and [in Chinese] |Show fewer author(s)

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References(2)

[3] [3] Kriss Michael,Parulski Ken, David Lewis. Critical technologies for still imaging systems[A]. SPIE[C]. 1989,1082. 157-183.

[5] [5] Jim Janesick,Tom Ellion. Sandbox CCDs[A]. SPIE[C]. 1995,2415.2-41.

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Paper Information

Category: 红外技术及应用

Received: Aug. 26, 2003

Accepted: Oct. 8, 2003

Published Online: May. 25, 2006

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

CLP Journals

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