[1] [1] Zavada J M, Zhang D H. Solid-State Electronics, 1995, 38(7): 1285.

[2] [2] Ellis C J, Mair R M, Li J, et al. Mat Sci Eng B-Solid, 2001, 81(1-3): 167.

[3] [3] Lozykowski H J, Jadwisienczak W M, Han J, et al. Applied Physics Letters, 2000, 77(6): 767.

[4] [4] Kim J H, Holloway P H. Adv. Mater, 2005, 17(1): 91.

[5] [5] WU Xing-long, YAN Feng, BAO Xi-mao, et al. Applied Physics Letters, 1996, 68(15): 2091.

[6] [6] Torii K, Ono M, Sota T, et al. Physical Review B, 2000, 62(16): 10861.

[7] [7] Siegle H, Kaschner A, Hoffmann A, et al. Physical Review B, 1998, 58(20): 13619.

[8] [8] Perlin P, Camassel J, Knap W, et al. Applied Physics Letters, 1995, 67(17): 2524.

[9] [9] Ponce F A, Steeds J W, Dyer C D, et al. Applied Physics Letters, 1996, 69(18): 2650.

[10] [10] Limmer W, Ritter W, Sauer R, et al. Applied Physics Letters, 1998, 72(20): 2589.

[11] [11] Kozawa T, Kachi T, Kano H, et al. Journal of Applied Physics, 1994, 75(2): 1098.

[12] [12] Siegle H, Kaczmarczyk G, Filippidis L, et al. Physical Review B, 1997, 55(11): 7000.

[13] [13] Harima H. Journal of Physics-Condensed Matter, 2002, 14(38): R967.

[14] [14] Katsikini M, Papagelis K, Paloura E C, et al. Journal of Applied Physics, 2003, 94(7): 4389.

[15] [15] Azuhata T, Matsunaga T, Shimada K, et al. Physica B-Condensed Matter, 1996, 219(20): 493.

[16] [16] Vajpeyi A P, Chua S J, Fitzgerald E A, et al. Advanced Materials for Micro- and Nano-Systems (AMMNS), 2004-01.

[17] [17] Kozawa T, Kachi T, Kano H, et al. Journal of Applied Physics, 1995, 77(9): 4389.