Electro-Optic Technology Application, Volume. 30, Issue 6, 26(2015)
Research on Effect of Typical Process Defect on Optical Waveguide Characteristic
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FAN Zhe-hui, WANG Jian. Research on Effect of Typical Process Defect on Optical Waveguide Characteristic[J]. Electro-Optic Technology Application, 2015, 30(6): 26
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Received: Nov. 11, 2015
Accepted: --
Published Online: Jan. 20, 2016
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CSTR:32186.14.
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