Electro-Optic Technology Application, Volume. 30, Issue 6, 26(2015)

Research on Effect of Typical Process Defect on Optical Waveguide Characteristic

FAN Zhe-hui1 and WANG Jian2
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  • 2[in Chinese]
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    FAN Zhe-hui, WANG Jian. Research on Effect of Typical Process Defect on Optical Waveguide Characteristic[J]. Electro-Optic Technology Application, 2015, 30(6): 26

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    Paper Information

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    Received: Nov. 11, 2015

    Accepted: --

    Published Online: Jan. 20, 2016

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    DOI:

    CSTR:32186.14.

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