Opto-Electronic Engineering, Volume. 32, Issue 2, 30(2005)

[in Chinese]

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References(2)

[1] [1] YU X, WEI Z, YU G, el at. Depth-image-based surface measurement sensor[J]. SPIE, 2001,4275: 94-98.

[4] [4] YU X, CHEN D, WU L, el at. Structured-light based section outline sensor[J]. SPIE, 1999, 3835: 210-214.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(2): 30

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Received: Mar. 2, 2004

Accepted: --

Published Online: Nov. 14, 2007

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