Acta Physica Sinica, Volume. 69, Issue 16, 168101-1(2020)
Fig. 1. SEM images of samples a-d at different growth temperatures: (a) Sample A (800 ℃); (b) sample B (850 ℃); (c) sample C (900 ℃); (d) sample D (950 ℃).
Fig. 2. (a) The ultra-long gallium oxide nanoribbons of sample C under low magnification; (b) single gallium oxide nanoribbon at high magnification of sample C; (c) intertwined curved nanoribbons; (d) under high power, the agglomeration of the surface of the sample D nanoribbons deteriorates.
Fig. 3. (a) X-ray diffraction pattern of the sample C; (b) raman of the sample C.
Fig. 4. (a) TEM image of the sample C. Inset shows the SAED pattern; (b) HR-TEM image of the sample C.
The growth parameters of samples A–D at different temperature.
样品A—D在不同温度下的生长参数
The growth parameters of samples A–D at different temperature.
样品A—D在不同温度下的生长参数
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Qi Qi, Hai-Feng Chen, Zi-fan Hong, Ying-Ying Liu, Li-Xin Guo, Li-Jun Li, Qin Lu, Yi-Fan Jia.
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Received: Apr. 1, 2020
Accepted: --
Published Online: Jan. 4, 2021
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