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Optoelectronics Letters, Volume. 18, Issue 2, 103(2022)

Estimating the quality of stripe in structured light 3D measurement

[in Chinese]1... [in Chinese]1, [in Chinese]2, [in Chinese]3, [in Chinese]1, [in Chinese]4,*, [in Chinese]4, [in Chinese]4, [in Chinese]4, [in Chinese]4 and [in Chinese]4 |Show fewer author(s)
Author Affiliations
  • 1Tianjin Key Laboratory for Control Theory and Applications in Complicated Systems, School of Electrical Engineering and Automation, Tianjin University of Technology, Tianjin 300384, China
  • 2School of Intelligent Systems Engineering, Sun Yat-sen University, Guangzhou 510006, China
  • 3China Academy of Launch Vehicle Technology, Beijing 100076, China
  • 4School of Information Engineering, Zhengzhou University, Zhengzhou 450001, China
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Estimating the quality of stripe in structured light 3D measurement[J]. Optoelectronics Letters, 2022, 18(2): 103

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    Paper Information

    Received: Mar. 4, 2021

    Accepted: Aug. 23, 2021

    Published Online: Jan. 20, 2023

    The Author Email: (ieqxue@zzu.edu.cn)

    DOI:10.1007/s11801-022-1024-y

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology