Acta Photonica Sinica, Volume. 46, Issue 8, 816003(2017)
Thermal Stability of Mid-infrared SiO2 Thin Films Deposited by Dual Ion Beam Sputtering Method
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SHANG Peng, JI Yi-qin, ZHAO Dao-ling, XIONG Sheng-ming, LIU Hua-song, LI Ling-hui, TIAN Dong. Thermal Stability of Mid-infrared SiO2 Thin Films Deposited by Dual Ion Beam Sputtering Method[J]. Acta Photonica Sinica, 2017, 46(8): 816003
Received: Jan. 21, 2017
Accepted: --
Published Online: Oct. 30, 2017
The Author Email: Peng SHANG (shangpeng163@163.com)