The electrical derivative and low-frequency electrical noise parameters of semiconductor lasers can re- flect the internal defects of devices and are related to the radiation resistance performance of devices. This thesis intro- duces a irradiation resistance performance testing system for semiconductor lasers designed based on the electrical de- rivative and low-frequency electrical noise techniques , which can measure and extract the electrical conductivity and low-frequency electrical noise parameters of lasers. By evaluating the sensitive parameters of semiconductor lasers be- fore and after exposure to small doses of radiation , the irradiation resistance performance can be evaluated with the ad- vantages of sensitivity and non-destructive.