Laser & Optoelectronics Progress, Volume. 56, Issue 14, 141501(2019)

Surface Defect Detectionon Polished Surface Based on Reflection Moiré

Xianming Xiong1,2、*, Hongqiang Shi1, and Xingyu Zeng1
Author Affiliations
  • 1 School of Electrical Engineering and Automation, Guilin University of Electronic Technology, Guilin, Guangxi 541004, China
  • 2 Key Laboratory of Optoelectronics Information Processing for Guangxi Universities, Guilin, Guangxi 541004, China
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    References(12)

    [1] Berthold K P H[M]. Robot vision, 1-14(2014).

    [2] Chen S Y. A research of defect visual inspection system for specular and irregular surfaces[D]. Harbin: Harbin Institute of Technology, 1-8(2017).

    [6] Nayar S K, Ikeuchi K, Kanade T. Determining shape and reflectance of hybrid surfaces by photometric sampling[J]. IEEE Transactions on Robotics and Automation, 6, 418-431(1990).

    [9] Shen J, Castan S. An optimal linear operator for step edge detection[J]. CVGIP: Graphical Models and Image Processing, 54, 112-133(1992).

    [11] Zhang G, Ma Z M. An approach of using Gabor wavelets for texture feature extraction[J]. Journal of Image and Graphics, 15, 247-254(2010).

    [12] Zhang T Y, Suen C Y. A fast parallel algorithm for thinning digital patterns[J]. Communications of the ACM, 27, 236-239(1984).

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    Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501

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    Paper Information

    Category: Machine Vision

    Received: Dec. 18, 2018

    Accepted: Feb. 17, 2019

    Published Online: Jul. 12, 2019

    The Author Email: Xiong Xianming (5311128@qq.com)

    DOI:10.3788/LOP56.141501

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