Acta Photonica Sinica, Volume. 34, Issue 2, 176(2005)
Effects of the Structure of HfO2 Thin Films on Its Laser-induced Damage Threshold
HfO 2 films have been deposited with electron beam evaporation of HfO 2 and ion assisted electron beam evaporation of Hf. Optical and structural properties and laser induce damage threshold of the films have been studied; it was found that HfO 2 film deposited with electron beam evaporation of Hf with ion assisted technology shows uniform structural properties and higher laser induced damage threshold. The relation between structural and damage threshold of HfO 2 films has also been studied.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Effects of the Structure of HfO2 Thin Films on Its Laser-induced Damage Threshold[J]. Acta Photonica Sinica, 2005, 34(2): 176
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