Laser & Optoelectronics Progress, Volume. 52, Issue 7, 71202(2015)
Study on Defect Detection of Optical Thin Film Using Optical Coherence Tomography
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Qin Yuwei. Study on Defect Detection of Optical Thin Film Using Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71202
Category: Instrumentation, Measurement and Metrology
Received: Jan. 9, 2015
Accepted: --
Published Online: May. 29, 2015
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