Laser & Optoelectronics Progress, Volume. 52, Issue 7, 71202(2015)

Study on Defect Detection of Optical Thin Film Using Optical Coherence Tomography

Qin Yuwei1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(16)

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    CLP Journals

    [1] Bai Zhongchen, Huang Zhaoling, Hao Licai, Lu Anjiang, Qin Shuijie. Identifying Defects in Thin Film of High Power Laser Lens by Using Near Field Microimaging Method[J]. Chinese Journal of Lasers, 2017, 44(1): 103001

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    Qin Yuwei. Study on Defect Detection of Optical Thin Film Using Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71202

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 9, 2015

    Accepted: --

    Published Online: May. 29, 2015

    The Author Email:

    DOI:10.3788/lop52.071202

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