Periphery excitation of laser-induced CN fluorescence in plasma using laser-induced breakdown spectroscopy for carbon detection

Nan Zhao; Jiaming Li; Qiongxiong Ma; Liang Guo; Qingmao Zhang

doi:10.3788/COL202018.083001

Chinese Optics Letters, Volume. 18, Issue 8, 083001(2020)

Periphery excitation of laser-induced CN fluorescence in plasma using laser-induced breakdown spectroscopy for carbon detection

Nan Zhao^1,2, Jiaming Li^1,2,3、*, Qiongxiong Ma^1,2,3, Liang Guo^1,2,3, and Qingmao Zhang^1,2,3

Author Affiliations

¹Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou 510631, China

²Guangzhou Key Laboratory for Special Fiber Photonic Devices, South China Normal University, Guangzhou 510631, China

³Guangdong Provincial Key Laboratory of Industrial Ultrashort Pulse Laser Technology, Shenzhen 518055, China

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Figures & Tables(6)

Fig. 1. Experimental setup in this work.

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Fig. 2. Relative population and its first derivative of CN radicals in $X^{2} Σ^{+}$ .

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Fig. 3. Spectra of the $B^{2} Σ^{+} - X^{2} Σ^{+}$ (0, 0) transition acquired by LIBS (black line) and LIBS-LIF (red line).

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Fig. 4. Process of laser-induced CN fluorescence in LIBS: (a) ablation, (b) atomization, (c) combination, and (d) excitation.

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Fig. 5. Self-defined XY coordinate system on the plasma.

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Fig. 6. Intensity map of CN $B^{2} Σ^{+} - X^{2} Σ^{+}$ (0, 0) 388.34 nm with different excitation points at the plasma.

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Nan Zhao, Jiaming Li, Qiongxiong Ma, Liang Guo, Qingmao Zhang. Periphery excitation of laser-induced CN fluorescence in plasma using laser-induced breakdown spectroscopy for carbon detection[J]. Chinese Optics Letters, 2020, 18(8): 083001

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Paper Information

Category: Spectroscopy

Received: May. 9, 2020

Accepted: Jun. 10, 2020

Posted: Jun. 10, 2020

Published Online: Jul. 10, 2020

The Author Email: Jiaming Li (jmli@m.scnu.edu.cn)

DOI:10.3788/COL202018.083001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology