Opto-Electronic Engineering, Volume. 37, Issue 5, 52(2010)
Flatness Measurement of Large Annular Planes Based on Three-point Method
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DAI Xiao-lei, CAO Xue-dong, YANG Wen-zhi, WU Shi-bin. Flatness Measurement of Large Annular Planes Based on Three-point Method[J]. Opto-Electronic Engineering, 2010, 37(5): 52
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Received: Dec. 3, 2009
Accepted: --
Published Online: Sep. 7, 2010
The Author Email: Xiao-lei DAI (dl2625894@126.com)
CSTR:32186.14.
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