Acta Photonica Sinica, Volume. 51, Issue 6, 0611002(2022)
Deep Learning Based Method for Automatic Focus Detection in Digital Lithography
Fig. 1. Schematic diagram of a deep learning based digital lithography autofocus system
Fig. 2. Image of the centroid of each out-of-focus range on the CCD
Fig. 5. Confusion matrix for network models with different layer structures on the test set
Fig. 7. Normalized evaluation curves for different definition evaluation functions in a set of out-of-focus images
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Jupu YANG, Jialin DU, Fanxing LI, Qingrong CHEN, Simo WANG, Wei YAN. Deep Learning Based Method for Automatic Focus Detection in Digital Lithography[J]. Acta Photonica Sinica, 2022, 51(6): 0611002
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Received: Jan. 6, 2022
Accepted: Feb. 23, 2022
Published Online: Sep. 23, 2022
The Author Email: YAN Wei (yanwei@ioe.ac.cn)