Acta Photonica Sinica, Volume. 32, Issue 6, 742(2003)

Shearing Electron-scattered Speckle Interference Phase-shift System Study for Deflection Reflecting Mirror Manner of Automatic Control

[in Chinese]
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    References(4)

    [1] [1] Hung Y Y, Liang C Y.Image-shearing camera for direct measurement of surface strains.Appl Opt,1979,18(7):1046~1051

    [2] [2] Hung Y Y. Shearography: A new optical method for strain measurement and nondestructive testing.Opt Eng, 1982,21(3):391~395

    [3] [3] Hung Y Y. Recent development in practical optical nondestructive testing.SPIE,1554B,1991, 29~45

    [6] [6] Creath K.Phase-shifting speckle-pattern interferormetry.Appl Opt,1985,24(18):3053~3058

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    [in Chinese]. Shearing Electron-scattered Speckle Interference Phase-shift System Study for Deflection Reflecting Mirror Manner of Automatic Control[J]. Acta Photonica Sinica, 2003, 32(6): 742

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    Paper Information

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    Received: Dec. 25, 2002

    Accepted: --

    Published Online: Sep. 18, 2007

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