Electro-Optic Technology Application, Volume. 26, Issue 4, 81(2011)
Reliability Accelerated Testing(RAT)for Electronic Equipments
[4] [4] GREGG K Hobbs. Accelerated Reliability Engineering HALT and HASS[M]. New York: JohnW iley& Sons Ltd,2000.
[5] [5] MIL-HDBK-338B,ELECTRONICRELIABILITYDE-SIGNHANDBOOKS[S],1998.
Get Citation
Copy Citation Text
ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81
Category:
Received: Jun. 23, 2011
Accepted: --
Published Online: Sep. 9, 2011
The Author Email:
CSTR:32186.14.