Electro-Optic Technology Application, Volume. 26, Issue 4, 81(2011)
Reliability Accelerated Testing(RAT)for Electronic Equipments
References(2)
[4] [4] GREGG K Hobbs. Accelerated Reliability Engineering HALT and HASS[M]. New York: JohnW iley& Sons Ltd，2000.
[5] [5] MIL-HDBK-338B，ELECTRONICRELIABILITYDE-SIGNHANDBOOKS[S]，1998.
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ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81
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Received: Jun. 23, 2011
Accepted: --
Published Online: Sep. 9, 2011
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CSTR:32186.14.
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