Electro-Optic Technology Application, Volume. 26, Issue 4, 81(2011)

Reliability Accelerated Testing(RAT)for Electronic Equipments

ZHANG Qiu-ju1 and LIU Cheng-yu2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    The basic principle and general process of the reliability accelerated testing (RAT) are introduced,the formation and development of the reliability testing technique are also introduced. The implementation plan of the reliability accelerated testing is proposed. The highly accelerated life testing (HATL) and highly accelerated stress screening (HASS) are discussed,their differences and implementation methods are described. The testing stress type,level and condition are explained,and the basic principle of the application is given. Some advice is given to the cooperative staffs and the establishment of the database.

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    ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81

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    Paper Information

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    Received: Jun. 23, 2011

    Accepted: --

    Published Online: Sep. 9, 2011

    The Author Email:

    DOI:

    CSTR:32186.14.

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