Opto-Electronic Engineering, Volume. 32, Issue 4, 63(2005)

[in Chinese]

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    References(7)

    [1] [1] R.W.WHATMORE,N.M.SHORROCKS,C.O'HARA,et al.Lithium tetraborate:a new temperature-compensated SAW substrate material [J].Electron Lett,1981,17 (1):11-12.

    [2] [2] ROYER D,KMETIK V.Measurement of piezoelectric constants using an optical heterodyne interferometer [J].Electron Lett,1992,28(19):1828-1830.

    [5] [5] KOSINKI J A,LU Yicheng,BALLATO A.Pure-mode measurements of Li2B4O7 material properties[J].IEEE Trans.Ultrason.Ferroelec.Freq.Contr,1994,41(4):473-478.

    [6] [6] BOTTOM V E.Measurement of the piezoelectric coefficient of quartz using the Fabry-perot dilatometer [J].J.Appl Phys, 1970,41(10):3941-3944.

    [7] [7] QIU F,MISAWA K,CHENG X,et al.Determination of complex tensor components of electrooptic constants of dye-doped polymer film with Mach-Zehnder interferometer [J].Appl.Phys.Lett,1994,65(13):1605-1607.

    [8] [8] TENG C C,MAN H T.Simple reflection technique for measuring the electro-optic coefficient of poled polymers [J].Appl.Phys.Lett,1990,56(18):1734-1736.

    [9] [9] LI H G,CAO Z Q,LU H F,et al.Free-space coupling of a light beam into a symmetrical metal-cladding optical waveguide [J].Appl.Phys.Lett,2003,83(14 ):2757-2759.

    CLP Journals

    [1] Wang Shuang, Wang Zhibin, Zhang Minjuan, Li Xiao. High Sensitive Measurement of Crystal Electro-Optic Coefficients Based on Photo-Elastic Modulation[J]. Acta Optica Sinica, 2017, 37(3): 326001

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    Paper Information

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    Received: Sep. 20, 2004

    Accepted: --

    Published Online: Nov. 14, 2007

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