Zero-order-free meta-holograms in a broadband visible range

Rao Fu; Liangui Deng; Zhiqiang Guan; Sheng Chang; Jin Tao; Zile Li; Guoxing Zheng

doi:10.1364/PRJ.387397

Photonics Research, Volume. 8, Issue 5, 723(2020)

Zero-order-free meta-holograms in a broadband visible range

Rao Fu^1,2、†, Liangui Deng^1、†, Zhiqiang Guan^3、†, Sheng Chang³, Jin Tao², Zile Li^1,4、*, and Guoxing Zheng^1,2,5、*

Author Affiliations

¹Electronic Information School, Wuhan University, Wuhan 430072, China

²NOEIC, State Key Laboratory of Optical Communication Technologies and Networks, Wuhan Research Institute of Posts and Telecommunications, Wuhan 430074, China

³School of Physics and Technology, Center for Nanoscience and Nanotechnology, and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Wuhan University, Wuhan 430072, China

⁴e-mail: lizile@whu.edu.cn

⁵e-mail: gxzheng@whu.edu.cn

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CLP Journals

[1] Hongqiang Zhou, Xin Li, Zhentao Xu, Xiaowei Li, Guangzhou Geng, Junjie Li, Yongtian Wang, Lingling Huang. Correlated triple hybrid amplitude and phase holographic encryption based on a metasurface[J]. Photonics Research, 2022, 10(3): 678

[2] Xiangyu Zeng, Yuqin Zhang, Manna Gu, Zijun Zhan, Ruirui Zhang, Yu Zhang, Rui Sun, Changwei He, Chunxiang Liu, Chuanfu Cheng. Arbitrary manipulations of focused higher-order Poincaré beams by a Fresnel zone metasurface with alternate binary geometric and propagation phases[J]. Photonics Research, 2022, 10(4): 1117

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Rao Fu, Liangui Deng, Zhiqiang Guan, Sheng Chang, Jin Tao, Zile Li, Guoxing Zheng. Zero-order-free meta-holograms in a broadband visible range[J]. Photonics Research, 2020, 8(5): 723

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Paper Information

Category: Surface Optics and Plasmonics

Received: Jan. 6, 2020

Accepted: Mar. 8, 2020

Published Online: Apr. 23, 2020

The Author Email: Zile Li (lizile@whu.edu.cn), Guoxing Zheng (gxzheng@whu.edu.cn)

DOI:10.1364/PRJ.387397

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology