Chinese Optics Letters, Volume. 16, Issue 3, 031201(2018)
Multi-frequency lateral shear interferometer system for simultaneous measurement of thickness and three-dimensional shape
Fig. 1. Schematic of multi-frequency LSI system.
Fig. 2. Original fringes and their spectra: (a) Image with three different frequency fringes; (b) high-frequency fringe; (c) mid-frequency fringe; (d) low-frequency fringe; (e)–(g) spectra corresponding to (b)–(d), respectively.
Fig. 3. Geometry of the beam path.
Fig. 4. Results and main analysis procedure.
Fig. 5. Thickness change distribution.
Fig. 6. 3D shape of the thin film subjected to a shearing force.
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Xiangjun Dai, Tianyu Yuan, Hanyang Jiang, Xinxing Shao, Meiling Dai, Hai Yun, Fujun Yang, Xiaoyuan He. Multi-frequency lateral shear interferometer system for simultaneous measurement of thickness and three-dimensional shape[J]. Chinese Optics Letters, 2018, 16(3): 031201
Category: Instrumentation, measurement, and metrology
Received: Nov. 22, 2017
Accepted: Jan. 18, 2018
Published Online: Jul. 13, 2018
The Author Email: Xiangjun Dai (daixiangjun@sdut.edu.cn)