[1] [1] Wang Zhiqiang, Cheng Hong, Yang Guang, et al. Fast target location method of global image registration [J]. Infrared and Laser Engineering, 2015, 44(S1): 225-229. (in Chinese)

[2] [2] Gao Wen, Zhu Ming, He Baigen, et al. Overview of target tracking technology[J]. Chinese Optics, 2014, 7(3): 365-375. (in Chinese)

[3] [3] Mikolajczyk K, Schmid C. A performance evaluation of local descriptors[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2005, 27(10): 1615-1630.

[4] [4] Lowe D G. Distinctive image features from scale invariant key pionts [J]. International Journal of Computer Vision, 2004, 60(2): 91-110.

[5] [5] Wang Rui, Zhu Zhengdan. SIFT matching with color invariant characteristics and global context[J]. Optics and Precision Engineering, 2015, 23(1): 295-301. (in Chinese)

[6] [6] Cui Xiongwen, Wu Qinzhang, Jiang Ping, et al. Affine-invariant target tracking based on subspace representation[J].Infrared and Laser Engineering, 2015, 44(2): 769-774. (in Chinese)

[7] [7] Liu Chang, Zhu Feng, Xia Renbo. Monocular pose determination from coplanar two points and one line features[J]. Application Research of Computers, 2012, 29(8): 3145-3147. (in Chinese)

[8] [8] Liu Yinxiao, Wei Wei. Target points positioning algorithm based on rare information in uncalibrated camera′s photos[J].Application Research of Computers, 2015, 32(1): 272-275. (in Chinese)

[9] [9] Xiao Xizhen, Li Wentao, Tang Yandong, et al. Position-pose measurement of rectangle with unknown aspect ratio based on nonlinear optimization[J]. Information and Control, 2016, 45(1): 108-113. (in Chinese)

[10] [10] Li Ying, Ye Peijian, Peng Jing, et al. Artificial target recognition and location based on Mars exploration[J].Optics and Precision Engineering, 2015, 23(2): 566-572. (in Chinese)

[11] [11] Hastie T, Tibshirani R. Discriminant adaptive nearest neighbor classification[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1996, 18(6): 607-616.

[12] [12] Fischler M A, Bolles R C. Random sample consensus: a paradigm for model fitting with applications to image analysis and automated cartography[J]. Comm of the ACM, 1981, 24(6): 381-395.

[13] [13] Hough P V C. Methods and means for recognizing complex patterns: US, 3069654[P]. 1962-12-18.

[14] [14] Zhang Z. A flexible new technique for camera calibration[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2000, 22(11): 1330-1334.