Journal of Inorganic Materials, Volume. 36, Issue 6, 570(2021)

Texturing Technology on Multicrystalline Silicon Wafer by Metal-catalyzed Chemical Etching: a Review

Xiaowei WU1...2 and Jiayan LI12,* |Show fewer author(s)
Author Affiliations
  • 11. Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams, Dalian University of Technology, Dalian 116024, China
  • 22. School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, China
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    Figures & Tables(12)
    Schematic diagram of (a) MWSS cut technique and (b) DWS cut technique
    SEM images of (a, b) MWSS cut and (c, d) DWS cut multicrystalline silicon wafer surface
    Surface SEM morphology and reflectivity for texture surface of silicon wafer by acid etching
    Schematic diagram of MCCE[18]
    SEM images of silicon surfaces with (a) nano-texture, (b) micro-texture and (c) nano-micro-texture[31]
    (a) Schematic illustration of the main steps to prepare the submicron-in-micron (SIM) texture on the DWS mc-Si wafer and (b) experimental reflectance (curves) and simulated reflectance (scatter points) of three samples[33]
    Surface and cross-sectional SEM images of mc-Si grains after etching by alkali, Ag-MCCE and post-etching with different orientations[34]
    SEM images of Si nanostructures produced by Cu-MCCE method (a,b) before and (c,d) after the post-processing treatment and (e) schematic diagram of post-processing treatment[41]
    Cross-sectional SEM images of Si wafers after (a) Ag-MCCE and (b) Cu-MCCE, and (c) schematics of etching process by single Cu- and Ag-catalyzed chemical etching and Ag/Cu-cocatalyzed chemical etching[45]
    Relation between η of solar cells and reflectivity of texture surface[31,33-36,42,45,58-65]
    • Table 1. Performances for texture surfaces of DWS cut multicrystalline silicon prepared via different MCCE methods

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      Table 1. Performances for texture surfaces of DWS cut multicrystalline silicon prepared via different MCCE methods

      CatalystMethodRaηbRef.
      AgAg-MCCE + HF/HNO3+NaOH15.9%18.45%[31]
      AgArtificial defects (HF/HNO3/AgNO3)+HF/HNO319%19.07%[33]
      AgAlkali etching+Ag-MCCE+post etching16.85%19.4%[34]
      AgAg deposition (additive)+etching16.04%19.51%[35]
      AgAg deposition+etching (additive)18.17%19.56%[36]
      AgHF/HNO3+Ag-MCCE+RIE-20.69%[56]
      AgAg-MCCE23.7%20.89%[57]
      AgAg-MCCE+Modification by acid etching19.46%19.07%[58]
      AgHF/HNO3+Ag-MCCE+NSR process8.26%17.96%[59]
      AgHF/HNO3+Ag-MCCE+HF/HNO318.4%18.7%[60]
      CuCu-MCCE+post etching (HF/HNO3/H3PO4)-18.88%[41]
      CuCu-MCCE+HF/HNO318.21%19.06%[42]
      CuCu-MCCE22.4%19.03%[61]
      Ag-CuCu/Ag-MCCE12.08%19.49%[45]
      Ag-CuAlkali pretreatment (additive)+Cu/Ag-MCCE+post etching15.52%18.91%[62]
      Ag-CuCu/Ag-MCCE + NSR (H2O2/NaF)16.50%18.71%[63]
      Ag-CuCu/Ag-MCCE + NSR (H2O2/NaF)16.85%19.10%[64]
      NiNi-MCCE-16.60%[47]
      Cu-NiCu/Ni-MCCE (Cu(NO3)2+NiSO4+HF+H2O2)18.53%-[48]
    • Table 2. Comparison of making texture surface on DWS cut multicrystalline silicon by different MCCE methods

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      Table 2. Comparison of making texture surface on DWS cut multicrystalline silicon by different MCCE methods

      MethodAdvantagesDisadvantagesη
      Ag-MCCEMature technology, easy to form nanostructure, stable performanceHigh cost, difficult to recycle waste liquid20.89%
      Cu-MCCELow cost, easy to remove residual Cu, significantly reduce the impact of saw marksEasy to form the dense film, decreased etching rate, essential oxidants19.06%
      MCCE-additiveUniform size, stable performanceOrganic compounds increasing the cost of waste liquid treatment19.56%
      Composite MCCEComposite structureComplicated process, and difficult to recycle the waste liquid19.49%
      Other metal-MCCELow cost, composite structureInmature16.60%
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    Xiaowei WU, Jiayan LI. Texturing Technology on Multicrystalline Silicon Wafer by Metal-catalyzed Chemical Etching: a Review[J]. Journal of Inorganic Materials, 2021, 36(6): 570

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    Paper Information

    Category: REVIEW

    Received: Jun. 30, 2020

    Accepted: --

    Published Online: Nov. 25, 2021

    The Author Email: LI Jiayan (lijiayan@dlut.edu.cn)

    DOI:10.15541/jim20200361

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