Acta Optica Sinica, Volume. 34, Issue 10, 1031003(2014)
Application of Spectroscopic Ellipsometry for the Study of Electrical and Optical Properties of Indium Tin Oxide Thin Films
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Hu Hui, Zhang Liping, Meng Fanying, Liu Zhengxin. Application of Spectroscopic Ellipsometry for the Study of Electrical and Optical Properties of Indium Tin Oxide Thin Films[J]. Acta Optica Sinica, 2014, 34(10): 1031003
Paper Information
Category: Thin Films
Received: Apr. 4, 2014
Accepted: --
Published Online: Sep. 9, 2014
The Author Email: Hui Hu (huhui@mail.sim.ac.cn)
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