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Opto-Electronic Engineering, Volume. 33, Issue 8, 113(2006)

Accurate data extraction method for annular subaperture stitching technique

[in Chinese]1,2, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 2[in Chinese]
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    [1] [1] Ying-Moh LIU,George N.LAWRENCE,Christ L.KOLIOPOULOS.Subaperture testing of aspheres with annular zones[J].Applied Optics,1988,27 (21):4504-4513.

    [2] [2] Mauro Melozzi,Luca Pezzati,Alessandro Mazzoni.Testing aspheric surfaces using mulitiple annular interferograms[J].Optical Engineering,1993,32(5):1073-1079.

    [4] [4] Brian CATANZARO,James A.THOMAS,Eri J.COHEN.Comparison of full-aperture interferometry to sub-aperture stitched interferometry for a large diameter fast mirror[J].SPIE,2001,4444:224-237.

    [5] [5] Zygo corporation.MetroPro Manual,Version 7.4.2[Z].Zygo corporation,2001.

    CLP Journals

    [1] LI Bing, LIU Xiao, KANG Xiao-qing, GAO Fen. Compensation for Center Offset Error in Annular Subaperture Stitching Interferometry[J]. Acta Photonica Sinica, 2016, 45(9): 912001

    [2] Jia Dagong, Liu Kun, Jing Wencai, Wang Yan, Zhang Hongxia, Zhang Yimo. Method of Gas Detection Based on Intra-Cavity Erbium-Doped Fiber Laser[J]. Chinese Journal of Lasers, 2009, 36(9): 2384

    [3] DAI Yi-fan, ZENG Sheng-yue, CHEN Shan-yong. Iterative stitching algorithm for annular subaperture testing and its experimental verification[J]. Optics and Precision Engineering, 2009, 17(2): 251

    [4] Liu Zhengjun, Li Qi, Wang Qi. Target Recognition of Coherent Ladar Range Image Using Feature Selection[J]. Chinese Journal of Lasers, 2013, 40(8): 814003

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Accurate data extraction method for annular subaperture stitching technique[J]. Opto-Electronic Engineering, 2006, 33(8): 113

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    Paper Information

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    Received: Aug. 31, 2005

    Accepted: --

    Published Online: Nov. 14, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology