Fig. 1. Process of branch-cut method. (a) Unwrapping process; (b) Placing branch lines process

Fig. 1. [in Chinese]

Fig. 2. Direction of the light dark boundary in the phase diagram

Fig. 3. Example of residual point processing. (a) Phase diagram before processing; (b) Phase diagram after processing; (c) Direction of force and boundary line of each residual point

Fig. 4. Examples of removing residual points guided by electromagnetic force. (a) Original phase diagram; (b) Processed phase diagram; (c) Residual points in original phase diagram (885); (d) Residual points in processed phase diagram (14); (e) Branch lines in Goldstein unwrapping branch-cut (1047); (f) Branch lines in improved unwrapping branch-cut (19)

Fig. 5. Data interaction between CPU and GPU

Fig. 6. Simulation diagram. (a) Speckle pattern; (b) Phase diagram; (c) Phase diagram with residual points

Fig. 7. Comparison of the two branch-cut methods. (a) Branch lines in Goldstein branch-cut method; (b) Branch lines in improved branch-cut method; (c) Unwrapping diagram in Goldstein branch-cut method; (d) Unwrapping diagram in improved branch-cut method

Fig. 8. System measurement device. (a) Measurement platform and scene; (b) Michelson shearing device; (c) Measured object

Fig. 9. Unwrapping by branch-cut method. (a) The four speckle diagrams before deformation; (b) The four speckle diagrams after deformation; (c) Original phase diagram; (d) The phase diagram after filtering; (e) Unwrapping diagram by traditional branch-cut method; (g) Unwrapping diagram by improved branch-cut method