Acta Optica Sinica, Volume. 38, Issue 10, 1022004(2018)

Multi-Degree-of-Freedom Uniformity Correction Method of Illumination System in Lithography Machine

Weilin Cheng1,2、*, Fang Zhang1, Dongliang Lin1,2, Aijun Zeng1,2, Baoxi Yang1,2, and Huijie Huang1,2、*
Author Affiliations
  • 1 Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2 University of Chinese Academy of Sciences, Beijing 100049, China
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    A multi-degree-of-freedom uniformity correction method of the illumination system in a lithography machine is proposed. When the partial coherence factor of the illumination pupil changes, the fine tuning of the whole correction fingers along the direction of the optical axis in the proposed method is enough to make the light illumination uniformity meet the requirements. The effect of the three-dimensional spatial movement of correction fingers on the light illumination uniformity is analyzed by simulation, and the high efficiency of this method is verified.

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    Weilin Cheng, Fang Zhang, Dongliang Lin, Aijun Zeng, Baoxi Yang, Huijie Huang. Multi-Degree-of-Freedom Uniformity Correction Method of Illumination System in Lithography Machine[J]. Acta Optica Sinica, 2018, 38(10): 1022004

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Jan. 31, 2018

    Accepted: May. 21, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/AOS201838.1022004

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