Measurement of Surface Scattering Characteristics of Black Materials in Thomson Scattering System

Peng Wang; Peng Yuan; Weiqiang Tan; Jian Zheng

doi:10.3788/AOS202040.2129002

Acta Optica Sinica, Volume. 40, Issue 21, 2129002(2020)

Measurement of Surface Scattering Characteristics of Black Materials in Thomson Scattering System

Peng Wang¹, Peng Yuan^1、*, Weiqiang Tan¹, and Jian Zheng^1,2

¹Key Laboratory of Geospace Environment of Chinese Academy of Sciences, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China

²IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240, China

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Peng Wang, Peng Yuan, Weiqiang Tan, Jian Zheng. Measurement of Surface Scattering Characteristics of Black Materials in Thomson Scattering System[J]. Acta Optica Sinica, 2020, 40(21): 2129002

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Paper Information

Category: Scattering

Received: Jul. 10, 2020

Accepted: Jul. 24, 2020

Published Online: Nov. 2, 2020

The Author Email: Yuan Peng (yuanpeng@ustc.edu.cn)

DOI:10.3788/AOS202040.2129002

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