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Infrared and Laser Engineering, Volume. 33, Issue 6, 662(2004)

Electrical properties of Ti/Al contacts on GaN UV detector

[in Chinese]*... [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Electrical properties of Ti/Al contacts on GaN UV detector[J]. Infrared and Laser Engineering, 2004, 33(6): 662

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    Received: Dec. 25, 2003

    Accepted: Feb. 11, 2004

    Published Online: May. 25, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology