Acta Optica Sinica, Volume. 38, Issue 1, 0112005(2018)
Exposure Time Optimization for Line Structured Light Sensor Based on Light Stripe Reliability Evaluation
Fig. 1. Light stripe images. (a) Under exposure (100 μs); (b) optimal exposure(2150 μs); (c) over exposure (10000 μs)
Fig. 2. Process of light stripe Gaussian reliability evaluation
Fig. 3. Extraction process of sub-pixel light stripe center position
Fig. 4. Positions of typical sections (p1-p16) on the light stripe
Fig. 5. Reliability evaluation results of typical sections' light stripe centers. (a) C varies with t; (b) R varies with t
Fig. 6. Building Ci(t)、Ri(t) variation models with logarithmic fitting
Fig. 7. I of typical section positions varies with exposure time t
Fig. 8. Platform of line structured light 3D measurement
Fig. 9. High-precision rack
Fig. 10. Measurement results. (a) Measured profiles of the 9th tooth; (b) RSSa varies with t
Fig. 11. Comparison of model measurement results. (a) Reconstructed model 1 (t=200 μs); (b) reconstructed model 2 (t=2000 μs); (c) reconstructed model 3 (t=5000 μs); (d) reconstructed model 4 (t=10000 μs); (e) cracks area; (f) potholes
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Taotao Li, Feng Yang, Ce Li, Liang Fang. Exposure Time Optimization for Line Structured Light Sensor Based on Light Stripe Reliability Evaluation[J]. Acta Optica Sinica, 2018, 38(1): 0112005
Category: Instrumentation, Measurement and Metrology
Received: Jul. 31, 2017
Accepted: --
Published Online: Aug. 31, 2018
The Author Email: Li Taotao (ltaotao1988@126.com)