Acta Optica Sinica, Volume. 38, Issue 1, 0112005(2018)

Exposure Time Optimization for Line Structured Light Sensor Based on Light Stripe Reliability Evaluation

Taotao Li1,2、*, Feng Yang1, Ce Li1, and Liang Fang1
Author Affiliations
  • 1 School of Mechanical Electronic & Information Engineering, China University of Mining & Technology, Beijing, Beijing 100083, China;
  • 2 School of Electromechanical Engineering, Pingxiang University, Pingxiang, Jiangxi 337055, China
  • show less
    Figures & Tables(12)
    Light stripe images. (a) Under exposure (100 μs); (b) optimal exposure(2150 μs); (c) over exposure (10000 μs)
    Process of light stripe Gaussian reliability evaluation
    Extraction process of sub-pixel light stripe center position
    Positions of typical sections (p1-p16) on the light stripe
    Reliability evaluation results of typical sections' light stripe centers. (a) C varies with t; (b) R varies with t
    Building Ci(t)、Ri(t) variation models with logarithmic fitting
    I of typical section positions varies with exposure time t
    Platform of line structured light 3D measurement
    High-precision rack
    Measurement results. (a) Measured profiles of the 9th tooth; (b) RSSa varies with t
    Comparison of model measurement results. (a) Reconstructed model 1 (t=200 μs); (b) reconstructed model 2 (t=2000 μs); (c) reconstructed model 3 (t=5000 μs); (d) reconstructed model 4 (t=10000 μs); (e) cracks area; (f) potholes
    • Table 1. Comparison of model evaluation parameters

      View table

      Table 1. Comparison of model evaluation parameters

      ParameterActualModel 1Model 2Model 3Model 4
      TD /mm2.0122.5852.2092.3562.612
      TD error δ /%028.59.817.129.8
      Profile count N628632602311
    Tools

    Get Citation

    Copy Citation Text

    Taotao Li, Feng Yang, Ce Li, Liang Fang. Exposure Time Optimization for Line Structured Light Sensor Based on Light Stripe Reliability Evaluation[J]. Acta Optica Sinica, 2018, 38(1): 0112005

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 31, 2017

    Accepted: --

    Published Online: Aug. 31, 2018

    The Author Email: Li Taotao (ltaotao1988@126.com)

    DOI:10.3788/AOS201838.0112005

    Topics