Infrared and Laser Engineering, Volume. 49, Issue 3, 0303019(2020)
Research on 3D imaging technology of light field based on structural light marker
[2] [2] Wanner S, Goldluecke B. Globally consistent depth labeling of 4D light field[C]Proceedings of IEEE Conference on Computer Vision Pattern Recognition, 2012: 41−48.
[4] [4] Ng R, Levoy M, Brédif M, et al. Light field photography with a hheld plenoptic camera[R]. Stanfd Technical Rept CTSR, 2005:1−11.
[5] [5] Ng R. Fourier Slice Photography[C]ACM Transactions on Graphics, 2005,24(3): 735−744.
[6] [6] Lumsdaine A, Gegiev T. The focused plenoptic camera[C]Proceedings of the ICCP (IEEE), 2009:1−8.
[7] T E Bishop, P Favaro. The light field camera: Extended depth of field, aliasing and superresolution. IEEE Trans Pattern Anal Mach Intell, 34, 972-986(2017).
[9] [9] Tao M W, Hadap S, Malik J, et al. Depth from combining defocus crespondence using lightfield cameras[C]Proceedings of IEEE International Conference on Computer Vision, IEEE, 2013: 673−680.
[11] [11] Wanner S, Goldluecke B. Globally consistent depth labeling of 4D light fields[C] Proceedings of IEEE Conference on Computer Vision Pattern Recognition, IEEE, 2012: 41−48.
[12] [12] Frese C, Gheta I. Robust depth estimation by fusion of stereo focus series acquired with a camera array[C] Proceedings of IEEE International Conference on Multisens fusion Intergration f Intelligent Systems, IEEE, 2006: 243−248.
[14] G Sansoni, M Carocci, R Rodella. Three-dimensional vision based on a combination of gray-code and phase-shift light projection: analysis and compensation of the systematic errors. Appl Opt, 31, 6565-6573(1999).
[15] X Liu, J Kofman. High-frequency background modulation fringe patterns based on a fringe-wavelength geometry-constraint model for 3D surface-shape measurement. Opt Express, 14, 16618-16628(2017).
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Qingyang Wu, Haotao Huang, Shunzhi Chen, Qifeng Li, Zefeng Chen, Xiaoting Lu. Research on 3D imaging technology of light field based on structural light marker[J]. Infrared and Laser Engineering, 2020, 49(3): 0303019
Received: Nov. 20, 2019
Accepted: --
Published Online: Apr. 22, 2020
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