Study on Thickness Uniformity of 4-inSilicon-based Cadmium Telluride

INFRARED, Volume. 41, Issue 11, 22(2020)

Zhen LI*... Da GAO, Jing-xia SHI and Cong WANG |Show fewer author(s)

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LI Zhen, GAO Da, SHI Jing-xia, WANG Cong. Study on Thickness Uniformity of 4-inSilicon-based Cadmium Telluride[J]. INFRARED, 2020, 41(11): 22

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Received: Aug. 13, 2020

Accepted: --

Published Online: Feb. 5, 2021

The Author Email: Zhen LI (liyuif@163.com)

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