Chinese Optics Letters, Volume. 3, Issue 0s, 62(2005)

Experimental study on the depth of electric field punching through into the absorption layer of APD

[in Chinese]1, [in Chinese]2, [in Chinese]3, [in Chinese]1, [in Chinese]1, [in Chinese]3, [in Chinese]2, and [in Chinese]1
Author Affiliations
  • 1School for Information and Opto-Electronic Science and Engineering, South China Normal University, Guangzhou 510631
  • 2Department of Applied Physics, South China University of Technology, Guangzhou 510641
  • 3College of Applied Physics, Guangdong University of Technology, Guangzhou 510090
  • show less
    References(16)

    [1] [1] S. Cova, M. Ghioni, A. Lacaita, C. Asmori, and F. Zappa, Appl. Opt. 35, 1956 (1996).

    [2] [2] G. Ribordy, N. Gisin, O. Guinnard, D. Stuck, M. Wegmuller, and H. Zbinden, J. Modern Opt. 51, 1381 (2004).

    [3] [3] Y. Kang, D. S. Bethune, W. P. Risk, and Y.-H. Lo, Proc. SPIE 5246, 512 (2003).

    [4] [4] A. Yoshizawa and H. Tsuchida, Technical Report of IEICE, LQE 64, 7 (2001).

    [5] [5] A. Tomita and K. Nakamura, Opt. Lett. 27, 1827 (2002).

    [6] [6] M. Viterbini, S. Nazzoli, M. Poll, A. Adriani, F. Nozzoli, A. Ottaviano, and S. Ponzo, Appl. Opt. 35, 5345 (1996).

    [7] [7] J. G. Rarity, T. E. Wall, K. D. Ridley, Ph. C. M. Owens, and P. R. Tapster, Appl. Opt. 39, 6746 (2000).

    [8] [8] N. Namekata, Y. Makino, and S. Inoue, Opt. Lett. 27, 954 (2002).

    [9] [9] R. V. Ramos and G. A. P. The, Microwave and Optical Technology Letters 37, 136 (2003).

    [10] [10] T. Maruyama, F. Narusawa, Y. Saitoi, M. Kudo, M. Tanaka, Y. Saitoi, and A. Nomura, Opt. Eng. 41, 395 (2002).

    [11] [11] C. Liao, J. Wang, Z. Wei, J. Guo, R. Li, F. Wang, and S. Liu, Acta. Photon. Sin. (to be published).

    [12] [12] I. Prochazka, Appl. Opt. 40, 6012 (2001).

    [13] [13] Ph. A. Hiskitt, G. S. Buller, A. Y. Loudon, J. M. Smith, I. Gontijo, A. C. Walker, P. D. Townsend, and M. J. Robertson, Appl. Opt. 39, 6818 (2000).

    [14] [14] G. E. Stillman and M. Wolfe, "Avalanche Photodiodes" in Semiconductor and Semimetals, Vol. 12: Infrared Detectors R. K. Willardson and A. C. Beer, (eds.) (Academic, New York, 1977).

    [15] [15] A. Yariv, Quantum Electronics (3rd edn.) (John Wiley and Sons Press, New York, 1989) p.13.

    [16] [16] M. Bass and E. W. Van Stryland (eds.) Handbook of Optics (2nd edn.) (McGRAW-HILL Press, New York, 1995).

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Experimental study on the depth of electric field punching through into the absorption layer of APD[J]. Chinese Optics Letters, 2005, 3(0s): 62

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: --

    Accepted: --

    Published Online: Mar. 5, 2007

    The Author Email:

    DOI:

    Topics