Chinese Optics Letters, Volume. 3, Issue 0s, 62(2005)
Experimental study on the depth of electric field punching through into the absorption layer of APD
Dark-current-voltage curves and photon-current-voltage curves were measured by a passive quenched circuit so that the voltage applied to the avalanche photodiode can be much higher than breakdown voltage in study on the depth of punch through. The photo-current-voltage curve indicated clearly the punch-through voltage while the dark current-voltage curve is insensitive to the punch through. Furthermore, the avalanches initiated by the photo-generated carrier at a voltage lower than that from the thermo-generated carriers and explained based on the different distribution of the carriers.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Experimental study on the depth of electric field punching through into the absorption layer of APD[J]. Chinese Optics Letters, 2005, 3(0s): 62