Infrared and Laser Engineering, Volume. 53, Issue 8, 20240131(2024)
High-precision spectral characteristic measurement and characterization system
Figures & Tables(10)
Fig. 1. Schematic diagram of a beam incident on the surface of a sample
Fig. 2. Research plan for high-precision spectral characterization and testing and characterization
Fig. 4. Theoretical design transmittance curve of narrow-band filter
Fig. 8. High precision spectral characteristic testing at different angles
Table 1. Processing parameter for preparing Ta2O5 and SiO2 films
View tableView in ArticleTable 1. Processing parameter for preparing Ta2O5 and SiO2 films
Parameter Ta2O5 SiO2 Ion beam voltage/V 1250 1250 Ion beam current/mA 600 600 Acceleration voltage/V 250 250 E/B 150% 150% Sedimentation rate/nm·s−1 0.30 0.20 Argon gas flow rate/mL·min−1 18 18 Oxygen flow rate/mL·min−1 30 30 Base temperature/℃ 150 150
Table 2. High precision spectral characteristic test results
View tableView in ArticleTable 2. High precision spectral characteristic test results
Data sources Center wavelength/ nm Peak transmittance Half height width/nm UV3600 531.80 59.75% 1.05 V-5002 531.20 57.26% 1.10 High precision test 532.00 87.23% 0.79
Tools
Get Citation
Copy Citation Text
Hongyan JIANG, Bing SUN, Deying CHEN, Yiqin JI, Tianhe WANG, Rongwei FAN. High-precision spectral characteristic measurement and characterization system[J]. Infrared and Laser Engineering, 2024, 53(8): 20240131
Paper Information
Category:
Received: Mar. 22, 2024
Accepted: --
Published Online: Oct. 29, 2024
The Author Email: FAN Rongwei (fanmmi@163.com)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20