Infrared and Laser Engineering, Volume. 49, Issue 2, 213001(2020)
Investigation of AFM tip characterization based on multilayer gratings
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Wu Ziruo, Cai Yanni, Wang Xingrui, Zhang Longfei, Deng Xiao, Cheng Xinbin, Li Tongbao. Investigation of AFM tip characterization based on multilayer gratings[J]. Infrared and Laser Engineering, 2020, 49(2): 213001
Paper Information
Category: 光电测量
Received: Nov. 5, 2019
Accepted: Dec. 15, 2019
Published Online: Mar. 10, 2020
The Author Email: Ziruo Wu (ziruo0930@163.com)
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