Electro-Optic Technology Application, Volume. 33, Issue 5, 24(2018)

Characteristic Analysis of 1.89 μm Tm:YLF Laser

DING Yu and YAN Xiu-sheng
Author Affiliations
  • [in Chinese]
  • show less
    References(8)

    [1] [1] Hderson S W, Suni P J M, Hale C P, et al. Coherent laser radar at 2 μm using solid-state lasers [C]//Geoscience and Remote Sensing, IEEE Transactions on, 1993, 31(1): 4-15.

    [2] [2] Humbach O, Fabian H, Grzesik U, et al. Analysis of OH absorption bands in synthetic silica[J]. Journal of Non-Crystalline Solids, 1996, 203: 19-26.

    [3] [3] Scholle K, Lamrini S, Koopmann P, et al. 2μm Laser Sources and Their Possible Applications Frontiers in Guided Wave Optics and Optoelectronics[C] // ISBN: 978-953-7619-82-4, 2010.

    [4] [4] Stoneman R C, Esterowitz L. Efficient 1.94-μm Tm:YALO Laser[J]. IEEE J Sel Top Quantum Electron, 1995, 1(1): 78-81.

    [5] [5] Temel B, zgür T, Hamit K, et al. Modulated and continuous-wave operations of low-power thulium (Tm:YAP) laser in tissue welding [J]. Journal of Biomedical Optics, 2010, 15(3): 038001.

    [6] [6] Sudesh V, Asai K, Kudou A, et al. Growth and characterization of Tm, Ho-doped LuLiF4 and YLiF4 crystals, in growth, fabrication, devices, and applications of laser and nonlinearmaterials [J]. J W Pierce and K I Schaffers, Editors, 2001: 153-160.

    [7] [7] Koen W, Strauss H, Bollig C, et al. High-power diode-end-pumped Tm: YLF slab laser delivering 189 W at 1890 nm[J]. Laser Technology, 2010.

    [8] [8] Strauss H J, Esser M J D, King G, et al. Tm:YLF slab wavelength-selected laser[J]. Optical Materials Express, 2012, 2(8): 1165-1170.

    Tools

    Get Citation

    Copy Citation Text

    DING Yu, YAN Xiu-sheng. Characteristic Analysis of 1.89 μm Tm:YLF Laser[J]. Electro-Optic Technology Application, 2018, 33(5): 24

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Sep. 3, 2018

    Accepted: --

    Published Online: Jan. 10, 2019

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics