Acta Photonica Sinica, Volume. 45, Issue 2, 212004(2016)

Highresolution Defect Inspection for Transparent Indiumtinoxide Conductive Film

CHEN Fanghan1...2,*, ZHAO Guangyu3, JIANG Shilong2 and PENG Wenda1 |Show fewer author(s)
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    CHEN Fanghan, ZHAO Guangyu, JIANG Shilong, PENG Wenda. Highresolution Defect Inspection for Transparent Indiumtinoxide Conductive Film[J]. Acta Photonica Sinica, 2016, 45(2): 212004

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    Paper Information

    Received: Sep. 7, 2015

    Accepted: --

    Published Online: Apr. 1, 2016

    The Author Email: Fanghan CHEN (chenhan620@163.com)

    DOI:10.3788/gzxb20164502.0212004

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