[1] [1] J A Throop, D J Aneshansley, W C Anger, et al.. Quality evaluation of apples based on surface defects: development of an automated inspection system[J]. Postharvest Biology and Technology, 2005, 36(3): 281-290.

[2] [2] Hao Shen, Shuxiao Li, Duoyu Gu, et al.. Bearing defect inspection based on machine vision[J]. Measurement, 2012, 45(4): 719-733.

[3] [3] Navid Razmjooy, B Somayeh Mousavi, F Soleymani. A real-time mathematical computer method for potato inspection using machine vision[J]. Computers and Mathematics with Applications, 2012, 63(1): 268-279.

[4] [4] Alberto Tellaeche, Gonzalo Pajares, Xavier P Burgos-Artizzu, et al.. A computer vision approach for weeds identification through support vector machines[J]. Applied Soft Computing, 2011, 11(1): 908-915.

[5] [5] Gao Shiyou, Ma Lei, Zhang Runsheng. Method of monitoring cutting point state in laser cutting plank process based on vision[J]. Chinese J Lasers, 2012, 39(2): 0203007.

[6] [6] J Jurkovic, M Korosec, J Kopa. New approach in tool wear measuring technique using CCD vision system[J]. Int J Machine Tools and Manufacture, 2005, 45(9): 1023-1030.

[7] [7] Dong Liu,Shitong Wang, Pin Cao, et al.. Dark-field microscopic image stitching method for surface defects evaluation of large fine optics[J]. Opt Express, 2013, 21(5): 5974-5987.

[8] [8] Huijing Zhang, Haobo Cheng, Hon Yuen Tam, et al.. High precision mode of subaperture stitching for optical surfaces measurement[J]. Frontiers of Optoelectronics, 2013, 6(2): 167-174.

[9] [9] Wang Xiaokun, Zheng Ligong, Zhang Xuejun. Testing convex aspheres by subaperture stitching interferometry[J]. Acta Optica Sinica, 2010, 30(7): 2022-2026.

[10] [10] Yang Yongying, Lu Chunhua, Liang Jiao, et al.. Microscopic dark-field scattering imaging and digitalization evaluation system of defects on optical devices precision surface[J]. Acta Optica Sinica, 2007, 27(6): 1031-1038.

[11] [11] Wang Lihua, Wu Shibin, Ren Ge, et al.. Location error compensation algorithm for measuring optical system wave front by sub-aperture stitching[J]. Acta Optica Sinica, 2012, 32(1): 0112003.

[12] [12] Zhao Liping, Li Xiang, Fang Zhongping. TIR illumination technology for defect inspection of plastic ophthalmic lenses[J]. Optics and Precision Engineering, 2011, 19(9): 2247-2254.

[13] [13] Peng Zhitao, Wei Xiaofeng, Yuan Haoyu, et al.. Signal noise ratio of total internal reflection edge illumination for optics damage inspection[J]. Infrared and Laser Engineering, 2011, 40(6): 1111-1114.

[14] [14] Han Siqi, Wang Lei. A survey of thresholding methods for image segmentation[J]. Systems Engineering and Electronics, 2002, 24(6): 91-94.

[15] [15] K S Fu, J K Mui. A survey on image segmentation[J]. Pattern Recognition, 1981, 13(1): 3-16.

[16] [16] Salem Saleh Al-Amri, N V Kalyankar, S D Khamitkar. Image segmentation by using edge detection[J]. Int J Computer Science and Engineering, 2010, 2(3): 804-807.

[17] [17] Raman Main, Himanshu Aggarwal. Study and comparison of various image edge detection technique[J].Int J Image Processing, 2009, 3(1): 1-12.

[18] [18] Fan Yong, ChenNiannian, Gao Lingling, et al.. Digital detection system of surface defects for large aperture optical elements[J]. High Power Laser and Particle Beams, 2009, 21(7): 1032-1036.