Fig. 1. The schematic diagram of SEB and SEGR in LDMOS

Fig. 2. Structure of radiation hardened LDMOS

Fig. 3. Transfer characteristic and breakdown characteristic of LDMOS

Fig. 4. Diagram of LDMOS SEE irradiation test

Fig. 5. Results of LDMOS SEE irradiation test

Fig. 6. Micrograph of non-hardened LDMOS SEB failure point

Fig. 7. Influence of Pwell doping concentration on LDMOS SEB voltage

Fig. 8. Influence of Pwell doping concentration on LDMOS breakdown characteristic

Fig. 9. LDMOS drain region electric field during SEE

Fig. 10. SEB simulation of non-hardened LDMOS

Fig. 11. SEB simulation of radiation hardened LDMOS

Fig. 12. Drain current changes of LDMOS during SEE simulation

Fig. 13. Gate oxide electric field changes of LDMOS during SEE simulation