A family of measurement basis for fast com-pressed imaging

Optoelectronics Letters, Volume. 15, Issue 1, 64(2019)

Lei CHEN1... Li-qiang LI2 and Quan-sen SUN1,* |Show fewer author(s)

Author Affiliations

¹School of Computer Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China

²Shangqiu Normal University, Shangqiu 476000, China

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CHEN Lei, LI Li-qiang, SUN Quan-sen. A family of measurement basis for fast com-pressed imaging[J]. Optoelectronics Letters, 2019, 15(1): 64

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Paper Information

Received: May. 24, 2018

Accepted: Jul. 3, 2018

Published Online: Apr. 11, 2019

The Author Email: Quan-sen SUN (sunquansen@njust.edu.cn)

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