Terahertz near-field microscopic imaging study of monolayer MoS<sub>2</sub> and WS<sub>2</sub>

Xinlin YE; Guanjun YOU

doi:10.3969/j.issn.1005-5630.2022.01.010

Optical Instruments, Volume. 44, Issue 1, 63(2022)

Terahertz near-field microscopic imaging study of monolayer MoS₂ and WS₂

Xinlin YE and Guanjun YOU^*

School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China

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Figures & Tables(5)

Fig. 1. Schematic diagram of THz s-SNOM

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Fig. 2. Optical micrograph of monolayer MoS₂ and WS₂

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Fig. 3. Topography and near-field amplitude of MoS₂

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Fig. 4. Graph of monolayer MoS₂ and WS₂ comparative near-field imaging

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Fig. 5. MoS₂ photoexcitation electric field simulation diagram

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Xinlin YE, Guanjun YOU. Terahertz near-field microscopic imaging study of monolayer MoS₂ and WS₂[J]. Optical Instruments, 2022, 44(1): 63

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Paper Information

Category: DESIGN AND RESEARCH

Received: Mar. 22, 2021

Accepted: --

Published Online: Mar. 22, 2022

The Author Email: YOU Guanjun (youguanjun@126.com)

DOI:10.3969/j.issn.1005-5630.2022.01.010

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

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