Acta Optica Sinica, Volume. 33, Issue 11, 1112006(2013)

Gloss Modification Model Design of SCE Measurement Based on D/8 Condition Color Spectrophotometer

Yuan Kun1,2、*, Yan Huimin1, Jin Shangzhong2, Cen Songyuan2, and Wang Jian2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(15)

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    [4] [4] L Simonot, M Elias. Color change due to a varnish layer [J]. Color Research & Application, 2004, 29(3): 196-204.

    [5] [5] L Simonot, M Elias. Color change due to a surface state modification [J]. Color Research & Application, 2003, 28(1): 45-49.

    [7] [7] Huang Min, Liu Haoxue, Cui Guihua, et al.. Testing uniform color spaces using printed samples with different gloss and color difference magnitudes [J]. Acta Optica Sinica, 2012, 32(7): 0733002.

    [8] [8] Liang Jing, Liao Ningfang, Song Li, et al.. Establishment and evaluation of color appearance datasets about low-glossiness color printing atlas [J]. Acta Optica Sinica, 2012, 32(5): 0533002.

    [10] [10] Zhongning Huang, Haisong Xu, M Ronnier Luo, et al.. Assessing total differences for effective samples having variations in color, coarseness, and glint [J]. Chin Opt Lett, 2010, 8(7): 717-720.

    [11] [11] CIE-15:2004. Colorimetry [S]. Vienna: CIE Central Bureau, 2004.

    [12] [12] ASTM-E2214-08. Standard Practice for Specifying and Verifying the Performance of Color Measuring Instruments [S]. West Conshohocken: ASTM International, 2008.

    [13] [13] Xu Haisong. Color Information and Engineering [M]. Hangzhou: Zhejiang University Press, 2005. 199-201.

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    CLP Journals

    [1] Dong Shuwen, Liao Ningfang, Lü Hang, Lin Kai, Cao Bin. Chromaticity Changes of Instrument Measurement for Color Patches with Different Gloss Levels[J]. Laser & Optoelectronics Progress, 2015, 52(6): 63301

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    Yuan Kun, Yan Huimin, Jin Shangzhong, Cen Songyuan, Wang Jian. Gloss Modification Model Design of SCE Measurement Based on D/8 Condition Color Spectrophotometer[J]. Acta Optica Sinica, 2013, 33(11): 1112006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 28, 2013

    Accepted: --

    Published Online: Oct. 20, 2013

    The Author Email: Kun Yuan (10930014@zju.edu.cn)

    DOI:10.3788/aos201333.1112006

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