Infrared Technology, Volume. 45, Issue 12, 1299(2023)

Reliability Estimation of Thermal Imagers Based on Prior Information

Shijin WANG1, Wanxiang ZHENG2, Jinghui CHENG2, Xiaoxuan WANG2, Tingyu YAN1, Changshan YAN2, and Qiaofang WANG2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    References(4)

    [9] [9] Xavier Breniere, Philippe Tribolet. IR detectors life cycle cost andreliability optimization for tactical application[C]//Proc. of SPIE, 2006:6395: 63950D.

    [10] [10] Xavier Breniere, Laurent Rubaldo, Frederic Dupont. Sofradir’s recentimprovement regarding the reliability and performance of HgCdTe IRdetectors[C/OL][2014-06-24]//Defense, Security Symposium, https://www.semanticscholar.org/paper/Sofradir's-recent-improvements-regarding-the-and-of-Breni%C3%A8re-Rubaldo/b2eba22cb82bd059b9f4d8f61e4fe7449b153224 (DOI:10.1117/ 12.2051705).

    [11] [11] Salazar W E. Report on the statue of linear drive coolers for thedepartment of defense standard advanced dewar assembly[C]//Proc. ofSPIE, 2003, 4820: (DOI: 10.1117/12.451177).

    [13] [13] Xavier Breniere, Alain Manissadjian, Michel Vuillermet. Reliabilityoptimization for IR detectors with compact cryo-coolers[C]//Proc. ofSPIE, 2005, 5783: (DOI: 10.1117/12.607591).

    Tools

    Get Citation

    Copy Citation Text

    WANG Shijin, ZHENG Wanxiang, CHENG Jinghui, WANG Xiaoxuan, YAN Tingyu, YAN Changshan, WANG Qiaofang. Reliability Estimation of Thermal Imagers Based on Prior Information[J]. Infrared Technology, 2023, 45(12): 1299

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Sep. 11, 2023

    Accepted: --

    Published Online: Jan. 17, 2024

    The Author Email:

    DOI:

    Topics