Optics and Precision Engineering, Volume. 30, Issue 18, 2232(2022)

Monte Carlo simulation and experiments of electron beam direct writing on curved

Mengtao XIE1...2, Junbiao LIU1,2,*, Pengfei WANG1, Yulu ZHANG1,2, and Li HAN12 |Show fewer author(s)
Author Affiliations
  • 1Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing0090, China
  • 2University of Chinese Academy of Sciences, Beijing100049, China
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    Figures & Tables(15)
    Simulation absorption of energy deposition density (0°)
    Simulation of absorption energy deposition density distributron (45°)
    SEM image of point exposure (0°)
    SEM image of point exposure (45°)
    Schematic diagram of calculating of absorption energy deposition density
    Map of the distribution of absorption energy deposition density with energies (0°)
    Map of the distribution of absorption energy deposition density with energies (15°)
    Map of the distribution of absorption energy deposition density with angles (x-axis)
    Map of the distribution of absorption energy deposition density with angles (y-axis)
    Map of the distribution of absorption energy deposition density with beam points (0°)
    Map of the distribution of absorption energy deposition density with beam points (15°)
    Map of the distribution of energy density with layers thickness(15°)
    Diagram of direct writing in tilt
    SEM images of point exposure in different parameters
    • Table 1. Specific values of point exposure

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      Table 1. Specific values of point exposure

      变量大小长/nm宽/nm长宽比

      入射

      角度

      401.43961.014
      10°356.9320.41.114
      15°400.1341.21.173

      入射

      能量

      5 keV274.6188.41.458
      10 keV255.1109.82.323
      15 keV320.2109.52.924
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    Mengtao XIE, Junbiao LIU, Pengfei WANG, Yulu ZHANG, Li HAN. Monte Carlo simulation and experiments of electron beam direct writing on curved[J]. Optics and Precision Engineering, 2022, 30(18): 2232

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    Paper Information

    Category: Micro/Nano Technology and Fine Mechanics

    Received: Jun. 7, 2022

    Accepted: --

    Published Online: Oct. 27, 2022

    The Author Email: LIU Junbiao (liujb@mail.iee.ac.cn)

    DOI:10.37188/OPE.20223018.2232

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