Acta Optica Sinica, Volume. 28, Issue 7, 1369(2008)
Noise Analysis of HgCdTe Photoconductive Detector with Different Response Wavelength
[1] [1] S. Borrello, M. Kinch, D. LaMont. Photoconductive HgCdTe detector performance with background variations[J]. Infrared Physics, 1977, 17(2): 121~125
[2] [2] V. Gopal, A. V. R. Warrier. On the optimum thickness of a photoconductive detector: a 0.1 eV HgCdTe detector [J]. Infrared Physics, 1984, 24(4): 387~390
[5] [5] Aldert van der Ziel. Unified Presentation of 1/f noise in electronic devices: fundamental 1/f noise sources[C]. Proc. IEEE, 1988, 76(3): 233~258
[6] [6] Joseph Kimchi, J. Ray Frederick, Theodore T. S. Wong. Low frequency noise in photoconductive HgCdTe detectors[C]. Proc. SPIE, 1985, 2812: 540~551
[7] [7] M. J. Uren, D. J. Day, M. J. Kirton. 1/f and random telegraph noise in silicon metal-oxide-semiconductor field-effect transistors[J]. Appl. Phys. Lett., 1985, 47(11): 1195~1197
[8] [8] D. Long. Letter to the editors on generation-recombination noise in infrared detector materials[J]. Infrared Physics, 1967, 7(2): 169~170
Get Citation
Copy Citation Text
Zhang Yan, Fang Jiaxiong. Noise Analysis of HgCdTe Photoconductive Detector with Different Response Wavelength[J]. Acta Optica Sinica, 2008, 28(7): 1369