Infrared and Laser Engineering, Volume. 35, Issue 3, 262(2006)

Infrared detection tester for electronic circuit fault

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    References(10)

    [1] [1] PEARSON K V.Printed circuit board fault detection and isolation using thermal imaging techniques[C]//Proceedings of SPIE,1986,636:122-125.

    [2] [2] HUGO P W.The infrared automatic mass screening(IRAMS)system for printed circuit board fault detection[C]//Proceedings of SPIE,1987,780:118-123.

    [3] [3] WILLIAMS V H,FIKE D K.Failure analysis of raw printed citcuit boards using infrared thermography[C]//Proceedings of SPIE,1987,780:139-147.

    [4] [4] ALLRED L G,KELLY G E.A system for fault diagnosis in electronic circuits using thermal imaging[C]//AUTOTESTCON '92.IEEE Systems Readiness Technology Conference,Conference Record,1992:455 -458.

    [5] [5] ALLRED L G,KELLY G E.A modified genetic algorithm for extracting thermal profiles from infrared image data[C]//Proceedings of SPIE,Neural and Stochastic Methods in Image and Signal Processing,1992,1766:77 -81.

    [6] [6] ALLRED L G,KELLY G E.A lossless image compression technique for infrared thermal images[C]//Proceedings of SPIE,Hybrid Hybrid Image and Signal Processing Ⅲ,1992,1702:230-237.

    [7] [7] ALLRED L G,HOWARD T R.Application of thermal imaging to electronic fault diagnosis[C]//Proceedings of SPIE,Thermosense ⅩⅥ:An International Conference on Thermal Sensing and Imaging Diagnostic Applications,1994,2245:224-230.

    [8] [8] ALLRED L G,HOWARD T R.Thermal imaging is the sole basis for repairing circuit cards in the F-16 flight control panel[C]//AUTOTESTCON' 96,Test Technology and Commercialization Conference Record,1996:418-424.

    [9] [9] ALLRED L G.Guidelines for successful implementation of infrared thermography for repairing electronic circuit cards[C]//AUTOTESTCON' 96,'Test Technology and Commercialization'.Conference Record,1996:410-417.

    [10] [10] ALLRED L G,HOWARD T R,SERPEN G.On -the -fly neural network construction for repairing F-16 flight control panel using thermal imaging[C]//Proceedings of SPIE,Thermosense ⅩⅧ:An International Conference on Thermal Sensing and Imaging Diagnostic Applications,1996,2766:284-294.

    CLP Journals

    [1] ZHOU Meng-te, YE Yu-tang, WANG Zhi-fang, LIU Ning, LUO Ying, SUN Qiang. Infrared Circuit Card Tester System[J]. Opto-Electronic Engineering, 2011, 38(8): 101

    [2] Gu Youlin, Wang Cheng, Yang Li, Ou Zongwei, Hu Yihua, Li Le, Zhao Yizheng, Chen Wei, Wang Peng. Infrared extinction before and after aspergillus niger spores inactivation[J]. Infrared and Laser Engineering, 2015, 44(1): 36

    [3] Yang Hui, Zhao Xuesong, Sun Yanfei, Wang Tiedong, Ye Jiesong. Bio-agents and aerosol measurement by fluorescence and depolarization short-distance lidar[J]. Infrared and Laser Engineering, 2017, 46(10): 1030004

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Infrared detection tester for electronic circuit fault[J]. Infrared and Laser Engineering, 2006, 35(3): 262

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Jul. 8, 2005

    Accepted: Oct. 15, 2005

    Published Online: Oct. 20, 2006

    The Author Email:

    DOI:

    Topics