Microelectronics, Volume. 52, Issue 5, 746(2022)

A Low Noise LDO with Foldback Current-Limit Protection

SONG Hao1... LUO Ping1,2, CHEN Jiahao1, HE Zhiyuan1 and WU Qianfeng1 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(8)

    [1] [1] HINOJO J M, MARTNEZ C L, TORRALBA A. Internally compensated LDO regulators for modern system-on-chip design [M]. Berlin: Springer Int Publishing AG, 2018: 10-15.

    [2] [2] HENG S, PHAM C K. A low-power high-PSRR low- dropout regulator with bulk-gate controlled circuit [J]. IEEE Trans Circ Syst II: Expr Brie, 2010, 57(4): 245-249.

    [3] [3] MING X, LI Q, ZHOU Z, et al. An ultrafast adaptively biased capacitorless LDO with dynamic charging control [J]. IEEE Trans Circ Syst II: Expr Brie, 2012, 59(1): 40-44.

    [4] [4] MANNAMA V, SABOLOTNY R, STRIK V. Ultra low noise low power LDO design [C]// Proceed Int Biennial Baltic Elec Conf. Tallinn, Estonia. 2006: 1-4.

    [5] [5] HOON S K, CHEN S, MALOBERTI F, et al. A low noise, high power supply rejection low dropout regulator for wireless system-on-chip applications [C]// Proceed IEEE Custom Integr Circ Conf. San Jose, CA, USA. 2005: 759-762.

    [6] [6] WONG K, EVANS D. A 150 mA low noise, high PSRR low-dropout linear regulator in 0.13 μm technology for RF SoC applications [C]// Proceed 32nd European Sol Sta Circ Conf. Montreaux, Switzerland. 2006: 532-535.

    [7] [7] GUO J, LEUNG K N. A fold-back current-limit circuit with load-insensitive quiescent current for CMOS low dropout regulator [C]// IEEE Int Symp Circ Syst. Taipei, China.2009: 2417-2420.

    [8] [8] LIN C, FENG Q. Design of current limiting circuit in low dropout linear voltage regulator [C]// Asia-Pacific Microw Conf Proceed. Suzhou, China. 2005.

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    SONG Hao, LUO Ping, CHEN Jiahao, HE Zhiyuan, WU Qianfeng. A Low Noise LDO with Foldback Current-Limit Protection[J]. Microelectronics, 2022, 52(5): 746

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    Paper Information

    Special Issue:

    Received: Sep. 6, 2022

    Accepted: --

    Published Online: Jan. 18, 2023

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.220332

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