Acta Optica Sinica, Volume. 42, Issue 16, 1612003(2022)

Light Field alpha Matting Based on Spatial-Angular Consistency

Tianyi Liu, Jun Qiu, Di He*, and Chang Liu
Author Affiliations
  • Institute of Applied Mathematics, Beijing Information Science and Technology University, Beijing 100101, China
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    Figures & Tables(17)
    Schematic diagram of mapping relationship of object points in different viewpoints
    Sparse representation of light field. (a) Central sub-aperture image and disparity map; (b) sub-aperture images
    Sub-aperture images and EPI. (a) Sub-aperture images; (b) EPI
    EPI of foreground alpha images
    Disparity map. (a) Disparity map of platonic scene; (b) disparity map of antinous scene
    Comparison of alpha images in different scenes. (a) Central sub-aperture alpha image; (b) alpha image of propagation algorithm at u=1,v=1; (c) alpha image of each sub-aperture matting algorithm at u=1,v=1
    Comparison of alpha matting results in different scenes. (a) Central sub-aperture alpha matting result; (b) alpha matting result of propagation algorithm at u=1,v=1; (c) alpha matting result of each sub-aperture matting algorithm at u=1,v=1
    EPIs of different scenes. (a) EPI obtained by propagation algorithm in platonic scene when v=1,y=92; (b) EPI obtained by each sub-aperture matting algorithm in platonic scene when v=1,y=92; (c) EPI obtained by propagation algorithm in antinous scene when v=1,y=445; (d) EPI obtained by each sub-aperture matting algorithm in antinous scene when v=1,y=445
    Central sub-aperture alpha image and disparity map of real light field data. (a) Central sub-aperture alpha image; (b) disparity map
    alpha images and alpha matting results of real light field data obtained by different algorithms. (a1)(a2) Central sub-aperture images; (b1)(b2) propagation algorithm; (c1)(c2) each sub-aperture matting algorithm
    EPIs of real light field data alpha matting. (a) EPI obtained by propagation algorithm in platonic scene when v=1,y=390; (b) EPI obtained by each sub-aperture matting algorithm in platonic scene when v=1,y=390; (c) EPI obtained by propagation algorithm in antinous scene when v=1,y=435; (d) EPI obtained by each sub-aperture matting algorithm in antinous scene when v=1,y=435
    Comparison of real light field data fusion (u=1,v=1). (a) Result obtained by propagation algorithm; (b) result obtained by each sub-aperture matting algorithm; (c) partial enlarged image of Fig. 12(a); (d) partial enlarged image of real light field data; (e) partial enlarged image of Fig. 12(b)
    EPI of fusing light field data (v=1,y=598). (a) EPI obtained by propagation algorithm; (b) EPI of real light field data; (c) EPI obtained by each sub-aperture matting algorithm
    Comparison of new generated viewpoint of real light field data (u=1,v=1.5). (a) New viewpoint generated by propagation algorithm; (b) new viewpoint generated by each sub-aperture matting algorithm
    EPIs of new viewpoint images of real light field data. (a) EPI of new viewpoint image obtained by propagation algorithm when v=1,y=71; (b) EPI of new viewpoint image obtained by each sub-aperture matting algorithm when v=1,y=71; (c) EPI of new viewpoint image obtained by propagation algorithm when v=1,y=528; (d) EPI of new viewpoint image obtained by each sub-aperture matting algorithm when v=1,y=528
    • Table 1. Consistency evaluation of synthetic light field alpha images

      View table

      Table 1. Consistency evaluation of synthetic light field alpha images

      ScenePropagation algorithmEach sub-aperture matting algorithm
      Platonic0.270.44
      Antinous0.380.65
    • Table 2. Consistency evaluation of real light field alpha images

      View table

      Table 2. Consistency evaluation of real light field alpha images

      ScenePropagation methodEach sub-aperture matting method
      Real light field data0.380.48
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    Tianyi Liu, Jun Qiu, Di He, Chang Liu. Light Field alpha Matting Based on Spatial-Angular Consistency[J]. Acta Optica Sinica, 2022, 42(16): 1612003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 14, 2022

    Accepted: Mar. 21, 2022

    Published Online: Aug. 4, 2022

    The Author Email: He Di (dihe@bistu.edu.cn)

    DOI:10.3788/AOS202242.1612003

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