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Optoelectronics Letters, Volume. 17, Issue 3, 165(2021)

Simultaneous displacement measurement method of multiple targets based on laser self-mixing interference

Yan ZHAO1...2,*, Ai-ling ZHANG1,3, and Hai-wei ZHANG13 |Show fewer author(s)
Author Affiliations
  • 1School of Electrical and Electronic Engineering, Tianjin University of Technology, Tianjin 300384, China
  • 2Tianjin Key Laboratory for Control Theory and Applications in Complicated Systems, Tianjin 300384, China
  • 3Tianjin Key Laboratory of Film Electronic and Communication Device, Tianjin 300384, China
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    [1] [1] Chen Jia-jian, Hu Hui-zhu, Miao Li-jun, Zhou Yi-lan and Shu Xiao-wu, Optics and Precision Engineering 27, 1435 (2019). (in Chinese)

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    [6] [6] Wang Xiu-fang, Yuan Ye, Chen Peng and Gao Bing-kun, Optical and Quantum Electronics 52, 34 (2020).

    [7] [7] Olivier D. Bernal, Han Cheng Seat, Usman Zabit, Frédéric Surre and Thierry Bosch, IEEE Sensors Journal 16, 7903 (2016).

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    [12] [12] Lu Liang, Zhang Wen-hua, Yang Bo, Zhou Jian-xi, Gui Hua-qiao and Yu Ben-li, IEEE Sensors Journal 13, 4387 (2013).

    [13] [13] Chen Peng, Liu Yu-wei, Gao Bing-kun and Jiang Chun-lei, Optics Communications 410, 693 (2018).

    [14] [14] Zhao Yi-chao and Su Yi, IEEE Transactions on Instrumentation and Measurement 69, 929 (2020).

    [15] [15] Z. H. Wu and N. E. Huang, Advances in Adaptive Data Analysis 1, 1 (2009).

    [16] [16] K. Dragomiretskiy and D. Zosso, IEEE Transactions on Signal Processing 62, 531 (2014).

    [17] [17] Li Xin, Ma Zeng-qiang, Kang De and Li Xiang, Measurement 155, 107554 (2020).

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    [20] [20] C. Bes, G. Plantier and T. Bosch, IEEE Transactions on Instrumentation and Measurement 55, 1101 (2006).

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    ZHAO Yan, ZHANG Ai-ling, ZHANG Hai-wei. Simultaneous displacement measurement method of multiple targets based on laser self-mixing interference[J]. Optoelectronics Letters, 2021, 17(3): 165

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    Paper Information

    Received: Feb. 28, 2020

    Accepted: May. 4, 2020

    Published Online: Sep. 2, 2021

    The Author Email: Yan ZHAO (tjut_eric@163.com)

    DOI:10.1007/s11801-021-0034-5

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology